A leading global foundry chose Nova's WMC metrology platform. The platform will serve as the 'tool-of-record' for measuring multiple layers in advanced semiconductor packaging. The foundry made this decision after a competitive evaluation. It will support numerous advanced production flows. The customer is expanding its manufacturing capacity.
This selection highlights growing industry adoption of Nova's WMC platform. The platform addresses complex challenges. These include wafer warpage and varied surface conditions. CEO Gaby Waisman stated the platform is in a "rapid growth phase." This win reinforces Nova's position as a key partner in the semiconductor industry.